Show simple item record

A fundamental multitechnique of SIMS depth profiling

dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorBrijs, Bert
dc.contributor.authorBender, Hugo
dc.contributor.authorAlay, Josep Lluis
dc.contributor.authorDe Coster, Walter
dc.date.accessioned2021-09-29T12:50:52Z
dc.date.available2021-09-29T12:50:52Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/417
dc.sourceIIOimport
dc.titleA fundamental multitechnique of SIMS depth profiling
dc.typeProceedings paper
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorBender, Hugo
dc.source.peerreviewno
dc.source.beginpageI10
dc.source.conferenceQuantitative Surface Analysis Conference - QSA. 8th International Conference
dc.source.conferencedate23/08/1994
dc.source.conferencelocationGuildford UK
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record