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Contact Interface Characterization of Graphene contacted MoS2 FETs

dc.contributor.authorKoladi Mootheri, Vivek
dc.contributor.authorMinj, Albert
dc.contributor.authorArutchelvan, Goutham
dc.contributor.authorLeonhardt, Alessandra
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorHeyns, Marc
dc.contributor.authorRadu, Iuliana
dc.contributor.authorLin, Dennis
dc.date.accessioned2023-08-10T09:15:54Z
dc.date.available2023-06-20T10:34:33Z
dc.date.available2023-08-10T09:15:54Z
dc.date.issued2021
dc.identifier.issn2380-632X
dc.identifier.otherWOS:000784773200005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41854.2
dc.sourceWOS
dc.titleContact Interface Characterization of Graphene contacted MoS2 FETs
dc.typeProceedings paper
dc.contributor.imecauthorKoladi Mootheri, Vivek
dc.contributor.imecauthorMinj, Albert
dc.contributor.imecauthorArutchelvan, Goutham
dc.contributor.imecauthorLeonhardt, Alessandra
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorLin, Dennis
dc.contributor.orcidimecMootheri, Vivek::0000-0002-1373-8405
dc.contributor.orcidimecMinj, Albert::0000-0003-0878-3276
dc.contributor.orcidimecAsselberghs, Inge::0000-0001-8371-3222
dc.contributor.orcidimecHeyns, Marc::0000-0002-1199-4341
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecKoladi Mootheri, Vivek::0000-0002-1373-8405
dc.identifier.doi10.1109/IITC51362.2021.9537337
dc.identifier.eisbn978-1-7281-7632-1
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.conferenceIEEE International Interconnect Technology Conference (IITC)
dc.source.conferencedateJUL 06-09, 2021
dc.source.conferencelocationKyoto
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/41854.2*2023-08-10T09:13:40Zvalidation by library/open access desk
120.500.12860/418542023-06-20T10:34:33Z

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