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Contact Interface Characterization of Graphene contacted MoS2 FETs
dc.contributor.author | Mootheri, Vivek | |
dc.contributor.author | Minj, Albert | |
dc.contributor.author | Arutchelvan, Goutham | |
dc.contributor.author | Leonhardt, Alessandra | |
dc.contributor.author | Asselberghs, Inge | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Radu, Iuliana | |
dc.contributor.author | Lin, Dennis | |
dc.date.accessioned | 2023-06-20T10:34:33Z | |
dc.date.available | 2023-06-20T10:34:33Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2380-632X | |
dc.identifier.other | WOS:000784773200005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41854 | |
dc.source | WOS | |
dc.title | Contact Interface Characterization of Graphene contacted MoS2 FETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mootheri, Vivek | |
dc.contributor.imecauthor | Minj, Albert | |
dc.contributor.imecauthor | Arutchelvan, Goutham | |
dc.contributor.imecauthor | Leonhardt, Alessandra | |
dc.contributor.imecauthor | Asselberghs, Inge | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.orcidimec | Mootheri, Vivek::0000-0002-1373-8405 | |
dc.contributor.orcidimec | Minj, Albert::0000-0003-0878-3276 | |
dc.contributor.orcidimec | Asselberghs, Inge::0000-0001-8371-3222 | |
dc.contributor.orcidimec | Heyns, Marc::0000-0002-1199-4341 | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-6388-729X | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.identifier.doi | 10.1109/IITC51362.2021.9537337 | |
dc.identifier.eisbn | 978-1-7281-7632-1 | |
dc.source.numberofpages | 3 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Interconnect Technology Conference (IITC) | |
dc.source.conferencedate | JUL 06-09, 2021 | |
imec.availability | Under review |
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