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Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity

dc.contributor.authorChizhik, S. A.
dc.contributor.authorMatvienko, A. A.
dc.contributor.authorSidelnikov, A. A.
dc.contributor.authorProost, Joris
dc.date.accessioned2021-10-14T12:44:02Z
dc.date.available2021-10-14T12:44:02Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4191
dc.sourceIIOimport
dc.titleModeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage3301
dc.source.endpage3309
dc.source.journalJ. Appl. Physics
dc.source.issue6
dc.source.volume88
imec.availabilityPublished - imec


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