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Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity
Publication:
Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chizhik, S. A.
;
Matvienko, A. A.
;
Sidelnikov, A. A.
;
Proost, Joris
Journal
J. Appl. Physics
Abstract
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1923
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1923
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations