Publication:
Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity
Date
| dc.contributor.author | Chizhik, S. A. | |
| dc.contributor.author | Matvienko, A. A. | |
| dc.contributor.author | Sidelnikov, A. A. | |
| dc.contributor.author | Proost, Joris | |
| dc.date.accessioned | 2021-10-14T12:44:02Z | |
| dc.date.available | 2021-10-14T12:44:02Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4191 | |
| dc.source.beginpage | 3301 | |
| dc.source.endpage | 3309 | |
| dc.source.issue | 6 | |
| dc.source.journal | J. Appl. Physics | |
| dc.source.volume | 88 | |
| dc.title | Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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