Show simple item record

Guidelines for cryogenic spaceborn CMOS testing and optimization

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMohammadzadeh, A.
dc.date.accessioned2021-10-14T12:44:20Z
dc.date.available2021-10-14T12:44:20Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4197
dc.sourceIIOimport
dc.titleGuidelines for cryogenic spaceborn CMOS testing and optimization
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage13
dc.source.endpage20
dc.source.conference4th European Workshop on Low Temperature Electronics - WOLTE-4
dc.source.conferencedate21/06/2000
dc.source.conferencelocationNoordwijk The Netherlands
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
4176.pdf
Size:
1.635Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record