dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Ravsher, Taras | |
dc.contributor.author | Kabuyanagi, Shoichi | |
dc.contributor.author | Fantini, Andrea | |
dc.contributor.author | Clima, Sergiu | |
dc.contributor.author | Garbin, Daniele | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.date.accessioned | 2023-08-10T12:31:10Z | |
dc.date.available | 2023-06-20T10:37:39Z | |
dc.date.available | 2023-08-10T12:31:10Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000672563100026 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41982.2 | |
dc.source | WOS | |
dc.title | Modeling and spectroscopy of ovonic threshold switching defects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Ravsher, Taras | |
dc.contributor.imecauthor | Kabuyanagi, Shoichi | |
dc.contributor.imecauthor | Fantini, Andrea | |
dc.contributor.imecauthor | Clima, Sergiu | |
dc.contributor.imecauthor | Garbin, Daniele | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Degraeve, R.::0000-0002-4609-5573 | |
dc.contributor.orcidimec | Ravsher, T.::0000-0001-7862-5973 | |
dc.contributor.orcidimec | Clima, S.::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Ravsher, Taras::0000-0001-7862-5973 | |
dc.contributor.orcidimec | Fantini, Andrea::0000-0002-3220-8856 | |
dc.contributor.orcidimec | Clima, Sergiu::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Garbin, Daniele::0000-0002-5884-1043 | |
dc.identifier.doi | 10.1109/IRPS46558.2021.9405114 | |
dc.identifier.eisbn | 978-1-7281-6893-7 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 21-24, 2021 | |
dc.source.conferencelocation | Monterey | |
dc.source.journal | na | |
imec.availability | Published - imec | |