Modeling and spectroscopy of ovonic threshold switching defects

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dc.contributor.author	Degraeve, R.
dc.contributor.author	Ravsher, T.
dc.contributor.author	Kabuyanagi, S.
dc.contributor.author	Fantini, A.
dc.contributor.author	Clima, S.
dc.contributor.author	Garbin, D.
dc.contributor.author	Kar, G. S.
dc.date.accessioned	2023-06-20T10:37:39Z
dc.date.available	2023-06-20T10:37:39Z
dc.date.issued	2021
dc.identifier.issn	1541-7026
dc.identifier.other	WOS:000672563100026
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/41982
dc.source	WOS
dc.title	Modeling and spectroscopy of ovonic threshold switching defects
dc.type	Proceedings paper
dc.contributor.imecauthor	Degraeve, R.
dc.contributor.imecauthor	Ravsher, T.
dc.contributor.imecauthor	Kabuyanagi, S.
dc.contributor.imecauthor	Fantini, A.
dc.contributor.imecauthor	Clima, S.
dc.contributor.imecauthor	Garbin, D.
dc.contributor.imecauthor	Kar, G. S.
dc.contributor.orcidimec	Degraeve, R.::0000-0002-4609-5573
dc.contributor.orcidimec	Ravsher, T.::0000-0001-7862-5973
dc.contributor.orcidimec	Clima, S.::0000-0002-4044-9975
dc.identifier.doi	10.1109/IRPS46558.2021.9405114
dc.identifier.eisbn	978-1-7281-6893-7
dc.source.numberofpages	5
dc.source.peerreview	yes
dc.source.conference	IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate	MAR 21-24, 2021
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/41982.2	2023-08-10T12:28:13Z	validation by library/open access desk
1	20.500.12860/41982*	2023-06-20T10:37:39Z