Show simple item record

Radiation performance of deep submicron CMOS technologies for space applications

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorMohammadzadeh, A.
dc.date.accessioned2021-10-14T12:44:24Z
dc.date.available2021-10-14T12:44:24Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4198
dc.sourceIIOimport
dc.titleRadiation performance of deep submicron CMOS technologies for space applications
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage113
dc.source.endpage119
dc.source.conferenceProceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications
dc.source.conferencedate11/10/2000
dc.source.conferencelocationJapan
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
4177.pdf
Size:
541.5Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record