| dc.contributor.author | Martin-Martinez, Javier | |
| dc.contributor.author | Diaz Fortuny, Javier | |
| dc.contributor.author | Saraza Canflanca, Pablo | |
| dc.contributor.author | Rodriguez, Rosana | |
| dc.contributor.author | Castro-Lopez, Rafael | |
| dc.contributor.author | Roca, Elisenda | |
| dc.contributor.author | Fernandez, Francisco V. | |
| dc.contributor.author | Nafria, Montserrat | |
| dc.date.accessioned | 2024-04-04T11:13:41Z | |
| dc.date.available | 2023-07-15T17:05:48Z | |
| dc.date.available | 2024-04-04T11:13:41Z | |
| dc.date.issued | 2023 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.other | WOS:001007431500177 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42164.2 | |
| dc.source | WOS | |
| dc.title | Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability | |
| dc.type | Proceedings paper | |
| dc.contributor.imecauthor | Diaz Fortuny, Javier | |
| dc.contributor.imecauthor | Saraza Canflanca, Pablo | |
| dc.contributor.orcidimec | Diaz Fortuny, Javier::0000-0002-8186-071X | |
| dc.contributor.orcidimec | Saraza Canflanca, Pablo::0000-0003-2155-8305 | |
| dc.identifier.doi | 10.1109/IRPS48203.2023.10118334 | |
| dc.identifier.eisbn | 978-1-6654-5672-2 | |
| dc.source.numberofpages | 9 | |
| dc.source.peerreview | yes | |
| dc.source.conference | 61st IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 26-30, 2023 | |
| dc.source.conferencelocation | Monterey | |
| dc.source.journal | N/A | |
| imec.availability | Published - imec | |
| dc.description.wosFundingText | This work was supported in part by MCIN/AEI/10.13039/501100011033 under Grant PID2019-103869RBC31 and Grant PID2019-103869RB-C32; and in part by the Consejeria de Economia, Conocimiento, Empresas y Universidad de la Junta de Andalucia and P. O. FEDER under Project US-1380876. | |
