dc.contributor.author | Dehaerne, Enrique | |
dc.contributor.author | Dey, Bappaditya | |
dc.contributor.author | Halder, Sandip | |
dc.contributor.author | De Gendt, Stefan | |
dc.date.accessioned | 2024-04-17T10:11:33Z | |
dc.date.available | 2023-07-28T17:39:34Z | |
dc.date.available | 2023-07-31T13:14:15Z | |
dc.date.available | 2024-04-17T10:11:33Z | |
dc.date.issued | 2023 | |
dc.identifier.isbn | 978-1-5106-6099-1 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:001022962000068 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42216.3 | |
dc.source | WOS | |
dc.title | Optimizing YOLOv7 for Semiconductor Defect Detection | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Dehaerne, Enrique | |
dc.contributor.imecauthor | Dey, Bappaditya | |
dc.contributor.imecauthor | Halder, Sandip | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.orcidimec | Dey, Bappaditya::0000-0002-0886-137X | |
dc.contributor.orcidimec | Halder, Sandip::0000-0002-6314-2685 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.contributor.orcidimec | Dehaerne, Enrique::0000-0001-9021-2469 | |
dc.identifier.doi | 10.1117/12.2657564 | |
dc.identifier.eisbn | 978-1-5106-6100-4 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 124962D | |
dc.source.conference | Conference on Metrology, Inspection, and Process Control XXXVII | |
dc.source.conferencedate | FEB 27-MAR 02, 2023 | |
dc.source.conferencelocation | San Jose | |
dc.source.journal | Proceedings of SPIE | |
dc.source.volume | 12496 | |
imec.availability | Published - imec | |