A simple and accurate deep submicron mismatch model

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Authors
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman
Conference
Proceedings of the 30th European Solid-State Device Research Conference - ESSDERC
Title
A simple and accurate deep submicron mismatch model
Publication type
Proceedings paper
Embargo date
9999-12-31
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