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dc.contributor.authorCoenen, David
dc.contributor.authorOprins, Herman
dc.contributor.authorDegraeve, Robin
dc.contributor.authorWolf, Ingrid De
dc.date.accessioned2023-08-07T13:11:22Z
dc.date.available2023-08-04T17:07:06Z
dc.date.available2023-08-07T13:11:22Z
dc.date.issued2023
dc.identifier.issn0278-0070
dc.identifier.otherWOS:001017411600015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42267.2
dc.sourceWOS
dc.titleBenchmarking of Machine Learning Methods for Multiscale Thermal Simulation of Integrated Circuits
dc.typeJournal article
dc.contributor.imecauthorCoenen, David
dc.contributor.imecauthorOprins, Herman
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorWolf, Ingrid De
dc.contributor.orcidimecOprins, Herman::0000-0003-0680-4969
dc.contributor.orcidimecCoenen, David::0000-0002-3732-1874
dc.identifier.doi10.1109/TCAD.2022.3216549
dc.source.numberofpages12
dc.source.peerreviewyes
dc.source.beginpage2264
dc.source.endpage2275
dc.source.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
dc.source.issue7
dc.source.volume42
imec.availabilityUnder review


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