dc.contributor.author | Feutmba, GIlles F. | |
dc.contributor.author | Da Silva, Leandro | |
dc.contributor.author | Singh, Nishant | |
dc.contributor.author | Breyne, Laurens | |
dc.contributor.author | De Geest, Kobe | |
dc.contributor.author | Puthenparampil George, John | |
dc.contributor.author | Bauwelinck, Johan | |
dc.contributor.author | Van Thourhout, Dries | |
dc.contributor.author | Yin, Xin | |
dc.contributor.author | Beeckman, Jeroen | |
dc.date.accessioned | 2023-08-11T07:29:40Z | |
dc.date.available | 2023-08-05T17:01:15Z | |
dc.date.available | 2023-08-09T10:35:02Z | |
dc.date.available | 2023-08-11T07:29:40Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2159-3930 | |
dc.identifier.other | WOS:001033545300003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42275.3 | |
dc.source | WOS | |
dc.title | High frequency characterization of PZT thin-films deposited by chemical solution deposition on SOI for integrated high speed electro-optic modulators | |
dc.type | Journal article | |
dc.contributor.imecauthor | Feutmba, GIlles F. | |
dc.contributor.imecauthor | Da Silva, Leandro | |
dc.contributor.imecauthor | Singh, Nishant | |
dc.contributor.imecauthor | Breyne, Laurens | |
dc.contributor.imecauthor | De Geest, Kobe | |
dc.contributor.imecauthor | Van Thourhout, Dries | |
dc.contributor.imecauthor | Yin, Xin | |
dc.contributor.orcidimec | Singh, Nishant::0000-0003-0609-1145 | |
dc.contributor.orcidimec | Van Thourhout, Dries::0000-0003-0111-431X | |
dc.contributor.orcidimec | Yin, Xin::0000-0002-9672-6652 | |
dc.contributor.orcidimec | Breyne, Laurens::0000-0001-5367-0436 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1364/OME.494148 | |
dc.source.numberofpages | 15 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2120 | |
dc.source.endpage | 2134 | |
dc.source.journal | OPTICAL MATERIALS EXPRESS | |
dc.source.issue | 7 | |
dc.source.volume | 13 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | . Fonds Wetenschappelijk Onderzoek (1S68218N)& nbsp; | |