dc.contributor.author | Reyntjens, Peter | |
dc.contributor.author | Van de Put, Maarten | |
dc.contributor.author | Vandenberghe, William G. | |
dc.contributor.author | Soree, Bart | |
dc.date.accessioned | 2023-10-13T07:55:44Z | |
dc.date.available | 2023-08-07T17:07:38Z | |
dc.date.available | 2023-10-13T07:55:44Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2380-632X | |
dc.identifier.other | WOS:001027381700006 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42299.2 | |
dc.source | WOS | |
dc.title | Ultrascaled graphene-capped interconnects: a quantum mechanical study | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Reyntjens, Peter | |
dc.contributor.imecauthor | Van de Put, Maarten | |
dc.contributor.imecauthor | Soree, Bart | |
dc.contributor.orcidimec | Van de Put, Maarten::0000-0001-9179-6443 | |
dc.contributor.orcidimec | Soree, Bart::0000-0002-4157-1956 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/IITC/MAM57687.2023.10154656 | |
dc.identifier.eisbn | 979-8-3503-1097-9 | |
dc.source.numberofpages | 3 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Interconnect Technology Conference (IITC) / IEEE Materials for Advanced Metallization Conference (MAM) | |
dc.source.conferencedate | MAY 22-25, 2023 | |
dc.source.conferencelocation | Dresden | |
dc.source.journal | na | |
imec.availability | Published - imec | |