dc.contributor.author | Ranjbar, Behnaz | |
dc.contributor.author | Klemme, Florian | |
dc.contributor.author | Genssler, Paul R. | |
dc.contributor.author | Amrouch, Hussam | |
dc.contributor.author | Jung, Jinhyo | |
dc.contributor.author | Dave, Shail | |
dc.contributor.author | So, Hwisoo | |
dc.contributor.author | Lee, Kyongwoo | |
dc.contributor.author | Shrivastava, Aviral | |
dc.contributor.author | Lin, Ji-Yung | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Mishra, Subrat | |
dc.contributor.author | Catthoor, Francky | |
dc.contributor.author | Biswas, Dwaipayan | |
dc.contributor.author | Kumar, Akash | |
dc.date.accessioned | 2024-03-25T15:33:17Z | |
dc.date.available | 2023-08-19T18:10:06Z | |
dc.date.available | 2023-08-21T07:43:09Z | |
dc.date.available | 2024-03-25T15:33:17Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1530-1591 | |
dc.identifier.other | WOS:001027444200217 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42363.3 | |
dc.source | WOS | |
dc.title | Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Lin, Ji-Yung | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Mishra, Subrat | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.imecauthor | Biswas, Dwaipayan | |
dc.contributor.orcidimec | Lin, Ji-Yung::0000-0001-9119-6069 | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.contributor.orcidimec | Mishra, Subrat::0000-0002-1435-3275 | |
dc.contributor.orcidimec | Biswas, Dwaipayan::0000-0002-1087-3433 | |
dc.identifier.eisbn | 979-8-3503-9624-9 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
dc.source.conferencedate | APR 17-19, 2023 | |
dc.source.conferencelocation | Antwerp | |
dc.source.journal | N/A | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This research was supported in part by 1) Advantest as part of the Graduate School "Intelligent Methods for Test and Reliability" (GS-IMTR) at the University of Stuttgart; 2) funding from National Science Foundation Grants No. CPS 1646235, CCF 1723476 - the NSF/Intel joint research center for Computer Assisted Programming for Heterogeneous Architectures (CAPA) at Arizona State University; 3) National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. RS-2022-00165225) at Yonsei University; 4) German Research Foundation (DFG) within the Cluster of Excellence Center for Advancing Electronics Dresden (CFAED) at the Technische Universitat Dresden. | |