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MRAM assessment at IMEC: an overview

dc.contributor.authorDas, Johan
dc.contributor.authorBoeve, Hans
dc.contributor.authorLagae, Liesbet
dc.contributor.authorEyckmans, Wouter
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorDe Boeck, Jo
dc.date.accessioned2021-10-14T12:46:56Z
dc.date.available2021-10-14T12:46:56Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4237
dc.sourceIIOimport
dc.titleMRAM assessment at IMEC: an overview
dc.typeMeeting abstract
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorDe Boeck, Jo
dc.source.peerreviewno
dc.source.beginpage20
dc.source.conferenceNEVAC / NNV Symposium "Toepassingen van Magnetische Nanostrukturen"
dc.source.conferencedate17/11/2000
dc.source.conferencelocationEindhoven The Netherlands
imec.availabilityPublished - imec


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