dc.contributor.author | Kovalevich, Tatiana | |
dc.contributor.author | Van Look, Lieve | |
dc.contributor.author | Franke, Joern-Holger | |
dc.contributor.author | Philipsen, Vicky | |
dc.date.accessioned | 2024-03-11T15:17:38Z | |
dc.date.available | 2023-08-27T17:28:47Z | |
dc.date.available | 2024-03-11T15:17:38Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1932-5150 | |
dc.identifier.other | WOS:001046441600008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42404.2 | |
dc.source | WOS | |
dc.title | Evaluation of Lines and Spaces printing and general understanding of imaging with dark field low-n mask | |
dc.type | Journal article | |
dc.contributor.imecauthor | Kovalevich, Tatiana | |
dc.contributor.imecauthor | Van Look, Lieve | |
dc.contributor.imecauthor | Franke, Joern-Holger | |
dc.contributor.imecauthor | Philipsen, Vicky | |
dc.contributor.orcidimec | Franke, Joern-Holger::0000-0002-3571-1633 | |
dc.contributor.orcidimec | Philipsen, Vicky::0000-0002-2959-432X | |
dc.contributor.orcidimec | Kovalevich, Tatiana::0000-0001-9633-8257 | |
dc.contributor.orcidimec | Van Look, Lieve::0009-0000-6198-024X | |
dc.identifier.doi | 10.1117/1.JMM.22.2.024401 | |
dc.source.numberofpages | 11 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 024401 | |
dc.source.endpage | N/A | |
dc.source.journal | JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 | |
dc.source.issue | 2 | |
dc.source.volume | 22 | |
imec.availability | Published - imec | |