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dc.contributor.authorDeng, Kerong
dc.contributor.authorErofeev, Ivan
dc.contributor.authorRay Chowdhuri, Angshuman
dc.contributor.authorSaidov, Khakimjon
dc.contributor.authorAabdin, Zainul
dc.contributor.authorPacco, Antoine
dc.contributor.authorPhilipsen, Harold
dc.contributor.authorHolsteyns, Frank
dc.contributor.authorVinh Huynh, Han
dc.contributor.authorMirsaidov, Utkur
dc.date.accessioned2024-02-05T13:03:01Z
dc.date.available2023-09-06T07:04:17Z
dc.date.available2024-02-05T13:03:01Z
dc.date.issued2023-09
dc.identifier.issn1012-0394
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42472.2
dc.titleControlled and Uniform Wet Etching of Molybdenum Nanowires
dc.typeProceedings paper
dc.contributor.imecauthorPacco, Antoine
dc.contributor.imecauthorPhilipsen, Harold
dc.contributor.imecauthorHolsteyns, Frank
dc.contributor.orcidimecPacco, Antoine::0000-0001-6330-5053
dc.contributor.orcidimecPhilipsen, Harold::0000-0002-5029-1104
dc.contributor.orcidimecHolsteyns, Frank::0009-0002-2123-452X
dc.date.embargo9999-12-31
dc.identifier.doihttps://doi.org/10.4028/p-c36cTY
dc.source.numberofpages5
dc.source.peerreviewyes
dc.subject.disciplineMaterials science
dc.source.beginpage351
dc.source.endpage355
dc.source.conference16th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS 2023)
dc.source.conferencedateSeptember 2023
dc.source.conferencelocationBrugge
dc.source.journalSolid State Phenomena Vol. 346
imec.availabilityPublished - imec


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