Publication:

Point defect reactions in silicon studied by in-situ high flux electron irradiation in a high voltage transmission electron microscope

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2045 since deposited on 2021-09-29
Acq. date: 2026-01-10

Citations

Metrics

Views

2045 since deposited on 2021-09-29
Acq. date: 2026-01-10

Citations