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Extension of a multilayer interconnection technology in MCM-Si with opto-electronic facilities
Publication:
Extension of a multilayer interconnection technology in MCM-Si with opto-electronic facilities
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Pauw, Herbert
;
De Smet, Herbert
;
Vanfleteren, Jan
;
Lernout, Jo
;
Van Calster, Andre
Journal
Microelectronics Reliability
Abstract
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1990
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1990
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations