| dc.contributor.author | De Wolf, Ingrid | |
| dc.date.accessioned | 2021-10-14T12:50:51Z | |
| dc.date.available | 2021-10-14T12:50:51Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4291 | |
| dc.source | IIOimport | |
| dc.title | Raman spectroscopy: a unique tool for the study of thin films | |
| dc.type | Oral presentation | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.source.peerreview | no | |
| dc.source.conference | MRS Spring Meeting 2000. Symposium G: Polycrystalline Metal and Magnetic Thin Films; 24-28 April 2000; San Francisco, Ca, USA. | |
| dc.source.conferencelocation | | |
| imec.availability | Published - imec | |
