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On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties

dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorKaniava, Arvydas
dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorBosman, Gijs
dc.contributor.authorJohlander, B.
dc.contributor.authorAdams, L.
dc.contributor.authorClauws, P.
dc.date.accessioned2021-09-29T12:51:31Z
dc.date.available2021-09-29T12:51:31Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/429
dc.sourceIIOimport
dc.titleOn the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1924
dc.source.endpage1931
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue6
dc.source.volume41
imec.availabilityPublished - imec
imec.internalnotes31st Annual International Nuclear and Space Radiation Effects Conference (NSREC); July 18-22, 1994; Tucson, Arizona, USA


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