Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Ultra-thin oxide reliability: searching for the thickness scaling limit
Publication:
Ultra-thin oxide reliability: searching for the thickness scaling limit
Copy permalink
Date
2000
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
4287.pdf
325.63 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Kaczer, Ben
;
Groeseneken, Guido
Journal
Microelectronics Reliability
Abstract
Description
Statistics
Views
1916
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2026-02-25
Citations
Statistics
Views
1916
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2026-02-25
Citations