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Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

dc.contributor.authorRybalchenko, Yevhenii
dc.contributor.authorMinj, Albert
dc.contributor.authorMedina Silva, Henry
dc.contributor.authorVillarreal, R.
dc.contributor.authorGroven, Benjamin
dc.contributor.authorLin, Dennis
dc.contributor.authorPereira, L. M. C.
dc.contributor.authorMorin, Pierre
dc.contributor.authorHantschel, Thomas
dc.contributor.authorAfanasiev, Valeri
dc.date.accessioned2024-01-23T11:29:26Z
dc.date.available2023-11-10T17:29:47Z
dc.date.available2024-01-23T11:29:26Z
dc.date.issued2023
dc.identifier.issn0038-1101
dc.identifier.otherWOS:001088917300001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43122.2
dc.sourceWOS
dc.titleScanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates
dc.typeJournal article
dc.contributor.imecauthorRybalchenko, Yevhenii
dc.contributor.imecauthorMinj, Albert
dc.contributor.imecauthorMedina Silva, Henry
dc.contributor.imecauthorGroven, Benjamin
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorMorin, Pierre
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecRybalchenko, Yevhenii::0000-0001-5643-7189
dc.contributor.orcidimecMinj, Albert::0000-0003-0878-3276
dc.contributor.orcidimecMedina Silva, Henry::0000-0003-1461-5703
dc.contributor.orcidimecGroven, Benjamin::0000-0002-5781-7594
dc.contributor.orcidimecMorin, Pierre::0000-0002-4637-496X
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.contributor.orcidimecLin, Dennis::0000-0002-1577-6050
dc.date.embargo2024-05-30
dc.identifier.doi10.1016/j.sse.2023.108781
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage108781
dc.source.endpageNA
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.issueNA
dc.source.volume209
imec.availabilityPublished - open access
dc.description.wosFundingTextThis work was done in the imec IIAP core CMOS programs and received funding from the European Union's Graphene Flagship grant agreement No 952792, 2D-experimental pilot line. It was also supported by the Research Foundation-Flanders (FWO) , Belgium grant 1SG1123N, and by the FLAGERA grant DIMAG.


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220.500.12860/43122.2*2024-01-23T11:23:23Zvalidation by library/open access desk
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