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Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substratesâ
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Authors
Rybalchenko, Yevhenii
;
Minj, Albert
;
Medina Silva, Henry
;
Villarreal, R.
;
Groven, Benjamin
;
Lin, Dennis
;
Pereira, L. M. C.
;
Morin, Pierre
;
Hantschel, Thomas
;
Afanasiev, Valeri
DOI
10.1016/j.sse.2023.108781
ISSN
0038-1101
Issue
NA
Journal
SOLID-STATE ELECTRONICS
Volume
209
Title
Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substratesâ
Publication type
Journal article
Embargo date
2024-05-30
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2
20.500.12860/43122.2
*
2024-01-23T11:23:23Z
validation by library/open access desk
1
20.500.12860/43122
2023-11-10T17:29:47Z
*Selected version
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