Browsing by author "Hantschel, Thomas"
Now showing items 1-20 of 202
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2D profiling with atomic force microscopy
Trenkler, Thomas; De Wolf, Peter; Stephenson, Robert; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
3D analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artefacts
Ke, Xiaoxing; Bals, Sarah; Cott, Daire; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2010) -
3D electrical characterization of CNT-based interconnects
Schulze, Andreas; Hantschel, Thomas; Dathe, Andre; Chiodarelli, Nicolo; Eyben, Pierre; Vandervorst, Wilfried (2011) -
A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications
Schulze, Andreas; Verhulst, Anne; Nazir, Aftab; Hantschel, Thomas; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Advanced Raman spectroscopy using nanofocusing of light
Nuytten, Thomas; Bogdanowicz, Janusz; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2017) -
Advances in metrology for complex epitaxial systems embedded in small volums
Vandervorst, Wilfried; Kumar, Arul; Meersschaut, Johan; Franquet, Alexis; Douhard, Bastien; Delmotte, Joris; Conard, Thierry; Nuytten, Thomas; Hantschel, Thomas; Loo, Roger (2015-05) -
AFM-based tomography for probing the electrical properties in confined volumes at the nanometer scale
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Mody, Jay; Vandervorst, Wilfried (2013) -
An optical force measurement system with microfabricated mirror probes and in-plane tips for semiconductor device characterization
Hantschel, Thomas; Arstila, Kai (2010) -
Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon
Eyben, Pierre; Clemente, Francesca; Vanstreels, Kris; Pourtois, Geoffrey; Sankaran, Kiroubanand; Clarysse, Trudo; Mody, Jay; Duriau, Edouard; Hantschel, Thomas; Vandervorst, Wilfried; Mylvaganam, Kausala; Zhang, Liangchi (2010) -
Analysis and modeling of the HV-SSRM nanocontact on silicon
Eyben, Pierre; Clemente, Francesca; Vanstreels, Kris; Pourtois, Geoffrey; Sankaran, Kiroubanand; Clarysse, Trudo; Mody, Jay; Duriau, Edouard; Hantschel, Thomas; Vandervorst, Wilfried; Mylvaganam, Kausala; Zhang, Liangchi (2009) -
Analysis of nanoparticles with elastic recoil detection
Arstila, Kai; Brijs, Bert; Giangrandi, Simone; Hantschel, Thomas; Vandervorst, Wilfried (2009) -
Anisotropic biaxial stress measurements in finFET channels through nano-focused raman spectroscopy
Nuytten, Thomas; Jamal, Muhammad Tahir; Hantschel, Thomas; Bogdanowicz, Janusz; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2016) -
Anisotropic etching of inverted pyramids in the sub-100 nm region
Hantschel, Thomas; Vandervorst, Wilfried (1997) -
Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy
Nuytten, Thomas; Bogdanowicz, Janusz; Witters, Liesbeth; Eneman, Geert; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2018) -
Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations
Han, Han; Hantschel, Thomas; Strakos, Libor; Vystavel, Tomas; Baryshnikova, Marina; Mols, Yves; Kunert, Bernardette; Langer, Robert; Vandervorst, Wilfried; Caymax, Matty (2020) -
Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques
Minj, Albert; Zhao, Ming; Bakeroot, Benoit; Paredis, Kristof; Wouters, Lennaert; Hantschel, Thomas; Decoutere, Stefaan (2021) -
Automated control of the nanoprober system for nanoscale electrical measurements
Arstila, Kai; Hantschel, Thomas; Nuytten, Thomas (2013) -
Backside analysis of ultra-thin film stacks in microelectronics technology using X-ray photoelectron spectroscopy
Hantschel, Thomas; Demeulemeester, Cindy; Suderie, Arnaud; Lacave, Thomas; Conard, Thierry; Vandervorst, Wilfried (2009) -
Boron doped nanodiamonds for nanoelectronics applications
Hantschel, Thomas; Yeghoyan, taguhi; Nuytten, Thomas; Nunn, Nicholas; Shenderova, Olga; Vandervorst, Wilfried (2016) -
Boron doping in hot filament MCD and NCD diamond films
Zimmer, Jerry; Hantschel, Thomas; Chandler, Gerry; Vandervorst, Wilfried; Peralta, Maria (2010)