Browsing by author "Hantschel, Thomas"
Now showing items 21-40 of 202
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Calibrated boron doped tip fabrication
Hantschel, Thomas; Zimmer, Jerry; Schulze, Andreas; Eyben, Pierre; Tsigkourakos, Menelaos; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2011) -
Can carbon nanotubes be preserved during FIB preparation of TEM samples?
Ke, Xiaoxing; Bals, Sara; Van Tenderloo, Gustaaf; Romo Negreira, Ainhoa; Hantschel, Thomas; Bender, Hugo (2008) -
Capabilities and limitations of Raman spectroscopy for carbon nanotubes analysis in the micro- and nano-electronics framework
Clemente, Francesca; Richard, Olivier; Hantschel, Thomas; Vandervorst, Wilfried (2007) -
Carbon nanotube growth for through-silicon via applications
Xie, Rongsie; Zhang, Can; van der Veen, Marleen; Arstila, Kai; Hantschel, Thomas; Chen, Bingan; Zhong, Guofang; Robertson, John (2013) -
Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?
Ke, Xiaoxing; Bals, Sara; Romo Negreira, Ainhoa; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2008-09) -
Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Wouters, Lennaert; Minj, Albert; Celano, Umberto; Hantschel, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2020) -
Carrier profiling of a cross-sectioned silicon nanowire by scanning spreading resistance microscopy
Hantschel, Thomas; Schulz, Volker; Zschaetzsch, Gerd; Eyben, Pierre; Verhulst, Anne; Schmidt, Volker; Vereecken, Philippe; Van den Bosch, Geert; Vandervorst, Wilfried (2007) -
Characterization of boron-doped diamond films for application in nanoscale electrical measurements
Hantschel, Thomas; Zimmer, Jerry; Moussa, Alain; Olanterae, Lauri; Clemente, Francesca; Geypen, Jef; Bender, Hugo; Vandervorst, Wilfried (2010) -
Characterization of conductive probes for atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Vandervorst, Wilfried; Hellemans, L.; Kulisch, W.; Oesterschulze, E.; Niedermann, P.; Sulzbach, T. (1999) -
Characterization of silicon cantilevers with integrated pyramidal tips in atomic force microscopy
Hantschel, Thomas; Stephenson, Robert; Trenkler, Thomas; De Wolf, Peter; Vandervorst, Wilfried (1999) -
Characterization of the initial stages of boron doped diamond growth in HFCVD
Hantschel, Thomas; Zimmer, Jerry; Chandler, Gerry; Vandervorst, Wilfried (2010) -
Characterizing the two-dimensional doping concentration inside silicon-nanowires using scanning spreading resistance microscopy
Hantschel, Thomas; Schulz, Volker; Schulze, Andreas; Angeletti, Esteban; Guder, Firat; Schmidt, Volker; Senz, Stephan; Eyben, Pierre; Vandervorst, Wilfried (2009) -
Composition quantification of microelectronics multilayer thin films by EDX: toward small scale analysis
Conard, Thierry; Arstila, Kai; Hantschel, Thomas; Franquet, Alexis; Vandervorst, Wilfried; Vecchio, Emma; Bauer, Frank; Burgess, Simon (2009) -
Conductive diamond probes with electroplated holder chips
Koelling, Sebastian; Hantschel, Thomas; Vandervorst, Wilfried (2007) -
Conductive diamond tips with sub-nanometer electrical resolution for characterization of nanoelectronics device structures
Hantschel, Thomas; Demeulemeester, Cindy; Eyben, Pierre; Schulz, Volker; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009) -
Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism
Serron, Jill; Minj, Albert; Spampinato, Valentina; Franquet, Alexis; Rybalchenko, Yevhenii; Boulon, Marie-Emmanuelle; Brems, Steven; Shi, Yuanyuan; Groven, Benjamin; Villarreal, Renan; Conard, Thierry; van der Heide, Paul; Hantschel, Thomas; Medina Silva, Henry (2023-05-17) -
Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
Spampinato, Valentina; Shi, Yuanyuan; Serron, Jill; Minj, Albert; Groven, Benjamin; Hantschel, Thomas; van der Heide, Paul; Franquet, Alexis (2023) -
Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques
Minj, Albert; Geens, Karen; Liang, Hu; Han, Han; Noel, Celine; Bakeroot, Benoit; Paredis, Kristof; Zhao, Ming; Hantschel, Thomas; Decoutere, Stefaan (2023) -
Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
Han, Han; Strakos, Libor; Hantschel, Thomas; Vystavel, Tomas; Porret, Clément; Loo, Roger; Caymax, Matty (2021) -
Determination par EDS de l'épaisseur et de la composition de films minces multicouches pour applications nanoélectroniques
Franquet, Alexis; Conard, Thierry; Gilbert, Matthieu; Hantschel, Thomas; Vandervorst, Wilfried (2012)