Browsing by author "Hantschel, Thomas"
Now showing items 41-60 of 202
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Development and optimization of FIB-based sample preparation for SSRM
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2010) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Joerg; Vandervorst, Wilfried (2010) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Jörg; Vandervorst, Wilfried (2011) -
Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology
Hantschel, Thomas; Cott, Daire; Palanne, Saku; Richard, Olivier; Arstila, Kai; Verhulst, Anne; Schulz, Volker; Eyben, Pierre; Vandervorst, Wilfried (2008) -
Diameter-dependent boron diffusion in silicon nanowire-based transistors
Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2013) -
Diamond electrical probes with sub-nanometer spatial resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Yeghoyan, Taguhi; Paredis, Kristof; Schulze, Andreas; Vandervorst, Wilfried (2016) -
Diamond nano-particle seeding for tip moulding application
Tsigkourakos, Menelaos; Hantschel, Thomas; Arstila, Kai; Vandervorst, Wilfried (2013) -
Diamond nano-particle seeding on three-dimensional geometries for tip moulding application
Tsigkourakos, Menelaos; Hantschel, Thomas; Arstila, Kai; Vandervorst, Wilfried (2012) -
Diamond nanoprobes for electrical probing of nanoelectronics device structures
Hantschel, Thomas; Clarysse, Trudo; Nuytten, Thomas; Paredis, Kristof; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Diamond Probes Technology
Hantschel, Thomas; Conard, Thierry; Kilpatrick, Jason; Cross, Graham (2019) -
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Tsigkourakos, Menelaos; Zha, Lichen; Nuytten, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2016) -
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Xu, Zheng; Paredis, Kristof; Schulze, Andreas; Vandervorst, Wilfried (2015) -
Diamond tip based automated two-point electrical probing on the nanoscale
Hantschel, Thomas; Arstila, Kai; Olanterae, Lauri; Vandervorst, Wilfried (2010) -
Diamond tips and cantilevers for the characterization of semiconductor devices
Malavé, A.; Oesterschulze, E.; Kulisch, W.; Trenkler, Thomas; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
Diamond tips for automated electrical probing inside a scanning electron microscopy system
Hantschel, Thomas; Arstila, Kai; Olantera, Lauri; Schulze, Andreas; Werner, Thilo; Eyben, Pierre; Clarysse, Trudo; Vandervorst, Wilfried (2011) -
Diamond tips for electrical AFM measurements with sub-nanometer resolution
Hantschel, Thomas; Tsigkourakos, Menelaos; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Schulze, Andreas; Vandervorst, Wilfried (2014) -
Diamond tips for electrical probing on the nanometer scale
Hantschel, Thomas; Arstila, Kai; Schulze, Andreas; Eyben, Pierre; Tsigkourakos, Menelaos; Vandervorst, Wilfried (2011) -
Dopant/carrier profiling for ULSI
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1998) -
Dopant/carrier profiling in non-planar or textured structures
Vandervorst, Wilfried; Douhard, Bastien; Eyben, Pierre; Seidel, F.; Hantschel, Thomas (2010) -
Doped nanodiamonds and their application for nanoelectronics sensing applications
Hantschel, Thomas; Yeghoyan, Taguhi; Nuytten, Thomas; Nunn, Nicholas; Shenderova, Olga; Vandervorst, Wilfried (2016)