Authors

Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Joerg; Vandervorst, Wilfried

Conference

E-MRS Spring Meeting Symposium I: Advanced Silicon Materials Research for Electronic and Photovoltaic Applications

Title

Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures

Publication type

Meeting abstract