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Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures

Date

2010
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dc.contributor.authorEyben, Pierre
dc.contributor.authorSeidel, Felix
dc.contributor.authorHantschel, Thomas
dc.contributor.authorSchulze, Andreas
dc.contributor.authorLorenz, Anne
dc.contributor.authorUruena De Castro, Angel
dc.contributor.authorVan Gestel, Dries
dc.contributor.authorJohn, Joachim
dc.contributor.authorHorzel, Joerg
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorSeidel, Felix
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned2021-10-18T16:18:54Z
dc.date.available2021-10-18T16:18:54Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17093
dc.source.conferenceE-MRS Spring Meeting Symposium I: Advanced Silicon Materials Research for Electronic and Photovoltaic Applications
dc.source.conferencedate6/06/2010
dc.source.conferencelocationStrasbourg France
dc.title

Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures

dc.typeMeeting abstract
dspace.entity.typePublication
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