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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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Acq. date: 2026-07-15

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736 since deposited on 2024-01-22
13last month
11last week
Acq. date: 2026-07-15

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1030 since deposited on 2024-01-22
Acq. date: 2026-07-15

Citations