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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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Acq. date: 2026-02-24

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569 since deposited on 2024-01-22
84last month
15last week
Acq. date: 2026-02-24

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1028 since deposited on 2024-01-22
1last month
Acq. date: 2026-02-24

Citations