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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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Acq. date: 2026-09-16

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811 since deposited on 2024-01-22
15last month
3last week
Acq. date: 2026-09-16

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1034 since deposited on 2024-01-22
Acq. date: 2026-09-16

Citations