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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques
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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques
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Date
2023
Journal article
https://doi.org/10.1103/PhysRevApplied.19.034081
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Minj, Albert
;
Geens, Karen
;
Liang, Hu
;
Han, Han
;
Noel, Celine
;
Bakeroot, Benoit
;
Paredis, Kristof
;
Zhao, Ming
;
Hantschel, Thomas
;
Decoutere, Stefaan
Journal
PHYSICAL REVIEW APPLIED
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Downloads
378
since deposited on 2024-01-22
85
last month
28
last week
Acq. date: 2025-12-15
Views
1027
since deposited on 2024-01-22
1
last month
1
last week
Acq. date: 2025-12-15
Citations