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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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Acq. date: 2026-05-16

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Downloads

718 since deposited on 2024-01-22
49last month
15last week
Acq. date: 2026-05-16

Views

1030 since deposited on 2024-01-22
Acq. date: 2026-05-16

Citations