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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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378 since deposited on 2024-01-22
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Acq. date: 2025-12-15

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378 since deposited on 2024-01-22
85last month
28last week
Acq. date: 2025-12-15

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1027 since deposited on 2024-01-22
1last month
1last week
Acq. date: 2025-12-15

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