Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

Rybalchenko, Yevhenii; Minj, Albert; Medina Silva, Henry; Villarreal, R.; Groven, Benjamin; Lin, Dennis; Pereira, L. M. C.; Morin, Pierre; Hantschel, Thomas; Afanasiev, Valeri

doi:10.1016/j.sse.2023.108781

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Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

Date

2023

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https://doi.org/10.1016/j.sse.2023.108781

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Rybalchenko, Yevhenii

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SOLID-STATE ELECTRONICS

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123 since deposited on 2023-11-10

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Acq. date: 2026-04-01

943 since deposited on 2023-11-10

Acq. date: 2026-04-01

Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

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