Publication:

Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

Date

2023
Journal article
https://doi.org/10.1016/j.sse.2023.108781
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dc.contributor.authorRybalchenko, Yevhenii
dc.contributor.authorMinj, Albert
dc.contributor.authorMedina Silva, Henry
dc.contributor.authorVillarreal, R.
dc.contributor.authorGroven, Benjamin
dc.contributor.authorLin, Dennis
dc.contributor.authorPereira, L. M. C.
dc.contributor.authorMorin, Pierre
dc.contributor.authorHantschel, Thomas
dc.contributor.authorAfanasiev, Valeri
dc.contributor.imecauthorRybalchenko, Yevhenii
dc.contributor.imecauthorMinj, Albert
dc.contributor.imecauthorMedina Silva, Henry
dc.contributor.imecauthorGroven, Benjamin
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorMorin, Pierre
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecRybalchenko, Yevhenii::0000-0001-5643-7189
dc.contributor.orcidimecMinj, Albert::0000-0003-0878-3276
dc.contributor.orcidimecMedina Silva, Henry::0000-0003-1461-5703
dc.contributor.orcidimecGroven, Benjamin::0000-0002-5781-7594
dc.contributor.orcidimecMorin, Pierre::0000-0002-4637-496X
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.contributor.orcidimecLin, Dennis::0000-0002-1577-6050
dc.date.accessioned2024-01-23T11:29:26Z
dc.date.available2023-11-10T17:29:47Z
dc.date.available2024-01-23T11:29:26Z
dc.date.embargo2024-05-30
dc.date.issued2023
dc.description.wosFundingTextThis work was done in the imec IIAP core CMOS programs and received funding from the European Union's Graphene Flagship grant agreement No 952792, 2D-experimental pilot line. It was also supported by the Research Foundation-Flanders (FWO) , Belgium grant 1SG1123N, and by the FLAGERA grant DIMAG.
dc.identifier.doi10.1016/j.sse.2023.108781
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43122
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage108781
dc.source.endpageNA
dc.source.issueNA
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages4
dc.source.volume209
dc.title

Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

dc.typeJournal article
dspace.entity.typePublication
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