Publication:

Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

Date

2023
Journal article
https://doi.org/10.1016/j.sse.2023.108781
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Author(s)

Rybalchenko, Yevhenii  
;
Minj, Albert  
;
Medina Silva, Henry  
;
Villarreal, R.
;
Groven, Benjamin  
;
Lin, Dennis  
;
Pereira, L. M. C.
;
Morin, Pierre  
;
Hantschel, Thomas  
;
Afanasiev, Valeri  

Journal

SOLID-STATE ELECTRONICS

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941 since deposited on 2023-11-10
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69 since deposited on 2023-11-10
Acq. date: 2025-10-24

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941 since deposited on 2023-11-10
Acq. date: 2025-10-24

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