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dc.contributor.authorHiblot, Gaspard
dc.contributor.authorRavsher, Taras
dc.contributor.authorLoo, Roger
dc.contributor.authorYengula Venkata Ramana, Bhuvaneshwari
dc.contributor.authorFranchina Vergel, Nathali
dc.contributor.authorFantini, Andrea
dc.contributor.authorHoushmand Sharifi, Shamin
dc.contributor.authorBazzazian, Nina
dc.contributor.authorWostyn, Kurt
dc.contributor.authorLabbate, Loris Angelo
dc.contributor.authorCouet, Sebastien
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2024-03-21T14:08:32Z
dc.date.available2023-11-24T17:33:11Z
dc.date.available2024-03-21T14:08:32Z
dc.date.issued2023
dc.identifier.issn1930-8876
dc.identifier.otherWOS:001090588900041
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43181.2
dc.sourceWOS
dc.titleNPN Si/SiGe memory selector with non-linearity>10<SUP>5</SUP> and ON-current>6MA/cm<SUP>2</SUP>
dc.typeProceedings paper
dc.contributor.imecauthorHiblot, Gaspard
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorBazzazian, Nina
dc.contributor.imecauthorWostyn, Kurt
dc.contributor.imecauthorLabbate, Loris Angelo
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorYengula Venkata Ramana, Bhuvaneshwari
dc.contributor.imecauthorFranchina Vergel, Nathali
dc.contributor.imecauthorHoushmand Sharifi, Shamin
dc.contributor.orcidimecHiblot, Gaspard::0000-0002-3869-965X
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecWostyn, Kurt::0000-0003-3995-0292
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecLabbate, Loris Angelo::0009-0003-8372-3713
dc.contributor.orcidimecHoushmand Sharifi, Shamin::0000-0002-0989-0666
dc.identifier.doi10.1109/ESSDERC59256.2023.10268470
dc.identifier.eisbn979-8-3503-0423-7
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage164
dc.source.endpage167
dc.source.conferenceIEEE 53rd European Solid-State Device Research Conference (ESSDERC)
dc.source.conferencedateSEP 11-14, 2023
dc.source.conferencelocationLisbon
dc.source.journalN/A
imec.availabilityPublished - imec


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