dc.contributor.author | Bogdanowicz, Janusz | |
dc.contributor.author | Oniki, Yusuke | |
dc.contributor.author | Kenis, Karine | |
dc.contributor.author | Puttarame Gowda, Pallavi | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Shamieh, Basel | |
dc.contributor.author | Leon, Yonatan | |
dc.contributor.author | Wormington, Matthew | |
dc.contributor.author | Van der Meer, Juliette | |
dc.contributor.author | Charley, Anne-Laure | |
dc.date.accessioned | 2024-02-27T08:32:39Z | |
dc.date.available | 2023-12-15T17:16:56Z | |
dc.date.available | 2024-02-27T08:32:39Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1932-5150 | |
dc.identifier.other | WOS:001099590700015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43265.2 | |
dc.source | WOS | |
dc.title | Model-free measurement of lateral recess in gate-all-around transistors with micro hard-X-ray fluorescence | |
dc.type | Journal article | |
dc.contributor.imecauthor | Bogdanowicz, Janusz | |
dc.contributor.imecauthor | Oniki, Yusuke | |
dc.contributor.imecauthor | Kenis, Karine | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Charley, Anne-Laure | |
dc.contributor.imecauthor | Puttarame Gowda, Pallavi | |
dc.contributor.orcidimec | Bogdanowicz, Janusz::0000-0002-7503-8922 | |
dc.contributor.orcidimec | Oniki, Yusuke::0000-0002-6619-1327 | |
dc.contributor.orcidimec | Kenis, Karine::0000-0001-7116-7498 | |
dc.contributor.orcidimec | Mertens, Hans::0000-0002-3392-6892 | |
dc.contributor.orcidimec | Charley, Anne-Laure::0000-0003-4745-0167 | |
dc.contributor.orcidimec | Puttarame Gowda, Pallavi::0009-0005-2886-5895 | |
dc.date.embargo | 2023-08-02 | |
dc.identifier.doi | 10.1117/1.JMM.22.3.034001 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 034001 | |
dc.source.endpage | N/A | |
dc.source.journal | JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 | |
dc.source.issue | 3 | |
dc.source.volume | 22 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | The authors would like to thank S. Schoofs (imec) for the Scanning Electron Microscopy measurements as well as the MCASA team (imec) for the TEM measurements. This project has received funding from the ECSEL Joint Undertaking (JU) (Grant No. 875999). The JU receives support from the European Union's Horizon 2020 research and innovation programme and Netherlands, Belgium, Germany, France, Austria, Hungary, United Kingdom, Romania, and Israel | |