Influence of tester, test method and device type on CDM ESD testing
dc.contributor.author | Verhaege, Koen | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.contributor.author | Egger, P. | |
dc.contributor.author | Gieser, H. | |
dc.date.accessioned | 2021-09-29T12:51:53Z | |
dc.date.available | 2021-09-29T12:51:53Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/436 | |
dc.source | IIOimport | |
dc.title | Influence of tester, test method and device type on CDM ESD testing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 49 | |
dc.source.endpage | 62 | |
dc.source.conference | Proceedings 16th Annual EOS/ESD Symposium | |
dc.source.conferencedate | 26/09/1994 | |
dc.source.conferencelocation | Las Vegas, NV USA | |
imec.availability | Published - open access |