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dc.contributor.authorVerhaege, Koen
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.authorEgger, P.
dc.contributor.authorGieser, H.
dc.date.accessioned2021-09-29T12:51:53Z
dc.date.available2021-09-29T12:51:53Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/436
dc.sourceIIOimport
dc.titleInfluence of tester, test method and device type on CDM ESD testing
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage49
dc.source.endpage62
dc.source.conferenceProceedings 16th Annual EOS/ESD Symposium
dc.source.conferencedate26/09/1994
dc.source.conferencelocationLas Vegas, NV USA
imec.availabilityPublished - open access


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