Publication:
Hot-carrier induced degradation of Ge/STI interfaces in Ge-on-Si junction devices
Loading...
Journal
Abstract
Description
Statistics
Views
690 since deposited on 2024-03-18
1last month
1last week
Acq. date: 2026-10-06
Citations
Statistics
Views
690 since deposited on 2024-03-18
1last month
1last week
Acq. date: 2026-10-06
Citations