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Cleaning, rinsing and drying effects in post-Cu CMP clean
Publication:
Cleaning, rinsing and drying effects in post-Cu CMP clean
Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fyen, Wim
;
Vos, Rita
;
Teerlinck, Ivo
;
Vrancken, Evi
;
Grillaert, Joost
;
Meuris, Marc
;
Mertens, Paul
;
Heyns, Marc
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1906
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1906
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations