Analysis of HBM ESD testers and specifications using a fourth order lumped element model
dc.contributor.author | Verhaege, Koen | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.contributor.author | Gieser, H. | |
dc.contributor.author | Russ, Christian | |
dc.contributor.author | Egger, P. | |
dc.contributor.author | Guggenmos, X. | |
dc.contributor.author | Kuper, F. G. | |
dc.date.accessioned | 2021-09-29T12:51:57Z | |
dc.date.available | 2021-09-29T12:51:57Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/437 | |
dc.source | IIOimport | |
dc.title | Analysis of HBM ESD testers and specifications using a fourth order lumped element model | |
dc.type | Journal article | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 325 | |
dc.source.endpage | 334 | |
dc.source.journal | Quality and Reliability Engineering International | |
dc.source.volume | 10 | |
imec.availability | Published - open access |