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Water-assisted positive ion contamination resulting in charge loss in nonvolatile memories

dc.contributor.authorGassot, P.
dc.contributor.authorIline, A.
dc.contributor.authorde Backer, E.
dc.contributor.authorTack, Marnix
dc.contributor.authorWellekens, Dirk
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorHaspeslagh, Luc
dc.date.accessioned2021-10-14T12:59:10Z
dc.date.available2021-10-14T12:59:10Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4383
dc.sourceIIOimport
dc.titleWater-assisted positive ion contamination resulting in charge loss in nonvolatile memories
dc.typeProceedings paper
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage268
dc.source.endpage271
dc.source.conferenceProceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2000
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - open access


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