dc.contributor.author | Gaubas, Eugenijus | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, C. | |
dc.contributor.author | Vanhellemont, Jan | |
dc.date.accessioned | 2021-10-14T12:59:16Z | |
dc.date.available | 2021-10-14T12:59:16Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4384 | |
dc.source | IIOimport | |
dc.title | Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.conference | International Conference on Electronic Materials & European Materials Research Society Spring Meeting. Symposium M: Advanced Cha | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |