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Perpendicular excitation-probe microwave absorption technique for carrier lifetime analysis in layered structures
Publication:
Perpendicular excitation-probe microwave absorption technique for carrier lifetime analysis in layered structures
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gaubas, Eugenijus
;
Simoen, Eddy
;
Claeys, Cor
;
Vanhellemont, Jan
Journal
Materials Science and Engineering B
Abstract
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1840
since deposited on 2021-10-14
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last month
Acq. date: 2025-12-16
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Metrics
Views
1840
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-16
Citations