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Perpendicular excitation-probe microwave absorption technique for carrier lifetime analysis in layered structures

dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorVanhellemont, Jan
dc.date.accessioned2021-10-14T12:59:22Z
dc.date.available2021-10-14T12:59:22Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4385
dc.sourceIIOimport
dc.titlePerpendicular excitation-probe microwave absorption technique for carrier lifetime analysis in layered structures
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1
dc.source.endpage6
dc.source.journalMaterials Science and Engineering B
dc.source.issue1_3
dc.source.volumeB73
imec.availabilityPublished - open access


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