dc.contributor.author | Marien, Jasper | |
dc.contributor.author | Jayapala, Murali | |
dc.contributor.author | Lambrechts, Andy | |
dc.contributor.author | Van Hoof, Chris | |
dc.contributor.author | Yurt, Abdulkadir | |
dc.date.accessioned | 2024-12-11T09:00:25Z | |
dc.date.available | 2024-05-04T17:57:00Z | |
dc.date.available | 2024-12-11T09:00:25Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 2770-0208 | |
dc.identifier.other | WOS:001209051500007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43905.2 | |
dc.source | WOS | |
dc.title | Single microparticle characterization using multi-wavelength lens-free imaging | |
dc.type | Journal article | |
dc.contributor.imecauthor | Marien, Jasper | |
dc.contributor.imecauthor | Jayapala, Murali | |
dc.contributor.imecauthor | Lambrechts, Andy | |
dc.contributor.imecauthor | Van Hoof, Chris | |
dc.contributor.imecauthor | Yurt, Abdulkadir | |
dc.contributor.orcidimec | Marien, Jasper::0000-0002-5090-5268 | |
dc.contributor.orcidimec | Jayapala, Murali::0000-0001-7917-0149 | |
dc.contributor.orcidimec | Lambrechts, Andy::0000-0001-7592-2999 | |
dc.contributor.orcidimec | Van Hoof, Chris::0000-0002-4645-3326 | |
dc.contributor.orcidimec | Yurt, Abdulkadir::0000-0002-1413-6756 | |
dc.date.embargo | 2024-03-11 | |
dc.identifier.doi | 10.1364/OPTCON.516373 | |
dc.source.numberofpages | 14 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 399 | |
dc.source.endpage | 412 | |
dc.source.journal | OPTICS CONTINUUM | |
dc.source.issue | 3 | |
dc.source.volume | 3 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | Wetenschappelijk (1S66718N) . | |