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Single microparticle characterization using multi-wavelength lens-free imaging
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Authors
Marien, Jasper
;
Jayapala, Murali
;
Lambrechts, Andy
;
Van Hoof, Chris
;
Yurt, Abdulkadir
DOI
10.1364/OPTCON.516373
ISSN
2770-0208
Issue
3
Journal
OPTICS CONTINUUM
Volume
3
Title
Single microparticle characterization using multi-wavelength lens-free imaging
Publication type
Journal article
Embargo date
2024-03-11
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2
20.500.12860/43905.2
*
2024-12-11T08:58:02Z
validation by library/open access desk
1
20.500.12860/43905
2024-05-04T17:57:00Z
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