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Dielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation method

dc.contributor.authorGirgis, E.
dc.contributor.authorBoeve, Hans
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorSchelten, J.
dc.contributor.authorRottlander, P.
dc.contributor.authorKohlstedt, H.
dc.contributor.authorGrünberg, P.
dc.date.accessioned2021-10-14T13:00:19Z
dc.date.available2021-10-14T13:00:19Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4394
dc.sourceIIOimport
dc.titleDielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation method
dc.typeJournal article
dc.contributor.imecauthorDe Boeck, Jo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage133
dc.source.endpage137
dc.source.journalJournal of Magnetism and Magnetic Materials
dc.source.issue1_2
dc.source.volume222
imec.availabilityPublished - open access


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